Atomic force microscope and its application
Atomic force microscope is a scanning probe microscope developed from the basic principle of scanning tunneling microscope. The emergence of the atomic force microscope has undoubtedly played a role in promoting the development of nanotechnology. The scanning probe microscope represented by the atomic force microscope is a general term for a series of microscopes that use a small probe to scan on the surface of the sample to provide high-magnification observation. AFM scanning can provide information on the surface state of various types of samples. Compared with conventional microscopes, the advantage of atomic force microscopy is that it can observe the sample surface at high magnification under atmospheric conditions, and it can be used for almost all samples (with certain requirements for surface finish), and the sample surface can be obtained without other sample preparation. 3D image of the . It can also perform roughness calculation, thickness, step width, block diagram or particle size analysis on the scanned 3D topography image.
AFM can detect many samples and provide data for surface research and production control or process development, which cannot be provided by conventional scanning surface roughness meters and electron microscopes.
Features of Atomic Force Microscopy
1. High resolution capabilities far exceed those of scanning electron microscopes (SEM), and optical roughness meters. The three-dimensional data of the sample surface meets the increasingly microscopic requirements of research, production, and quality inspection.
2. Non-destructive, the interaction force between the probe and the sample surface is less than 10-8N, which is much lower than the pressure of the previous stylus roughness meter, so it will not damage the sample, and there is no problem of electron beam damage in the scanning electron microscope. In addition, scanning electron microscopy requires coating of non-conductive samples, while atomic force microscopy does not.
3. It can be used in a wide range of applications, such as surface observation, size measurement, surface roughness measurement, particle size analysis, statistical processing of protrusions and pits, evaluation of film formation conditions, measurement of protective layer size steps, flatness evaluation of interlayer insulating films, VCD Coating evaluation, evaluation of friction treatment process of oriented film, defect analysis, etc.
4. The software has strong processing functions, and its three-dimensional image display size, viewing angle, display color, and gloss can be set freely. And can choose network, contour line, line display. Macro management of image processing, cross-sectional shape and roughness analysis, topography analysis and other functions.
