Differences Between Confocal Microscopes and Fluorescence Microscopes
Fluorescence microscopy is mainly used in the fields of biology and medical research, which can obtain fluorescent images of the internal microstructure of cells or tissues. It can observe physiological signals such as Ca2+, pH value, membrane potential, and changes in cell morphology at the subcellular level. It is a powerful research tool in the fields of morphology, molecular biology, neuroscience, pharmacology, genetics, and more.
The confocal microscope based on confocal technology is a detection instrument used for micro nano level measurements of various precision devices and material surfaces.
VT6000 laser confocal scanning microscope
The goal of materials science is to study the influence of material surface structure on its surface properties. Therefore, high-resolution analysis of surface morphology is of great significance for determining relevant parameters such as surface roughness, reflective characteristics, tribological properties, and surface quality. Confocal technology can measure various surface reflection characteristics of materials and obtain effective measurement data.
The VT6000 laser confocal scanning microscope is based on confocal microscopy technology, combined with precision Z-direction scanning modules, 3D modeling algorithms, etc. It can perform non-contact scanning of device surfaces and establish surface 3D images, achieving 3D measurement of device surface morphology. In the field of material production testing, it is possible to measure and analyze the surface morphology characteristics of various products, components, and materials, such as surface contour, surface defects, wear, corrosion, flatness, roughness, waviness, pore gaps, step height, bending deformation, and processing conditions.
The VT6000 confocal microscope from Zhongtu Instrument has been officially launched! 3D measurement images have clearer morphological details!
application
1.MEMS
Measurement of dimensions for micrometer and submicron level components, observation of surface morphology after various processes (development, etching, metallization, CVD, PVD, CMP, etc.), and analysis of defects.
2. Precision mechanical components, electronic devices
Measurement of dimensions for micrometer and submicron level components, observation of surface morphology after various surface treatment processes and welding processes, defect analysis, and particle analysis.
3. Semiconductor/LCD
Observation of surface morphology after various processes (development, etching, metallization, CVD, PVD, CMP, etc.), defect analysis, measurement of non-contact line width, step depth, etc.
4. Friction, corrosion and other surface engineering
Volume measurement of abrasion marks, roughness measurement, surface morphology, corrosion, and surface morphology after sub micron surface engineering.
