How confocal microscopy produces three-dimensional imaging
Confocal microscopy is an important microscopy technique that provides high-resolution and three-dimensional imaging capabilities, and is of great significance in fields such as materials science.
Principles of 3D imaging
The light beam emitted by the LED light source is focused on the surface of the sample after passing through a multi hole disk and objective lens. Afterwards, the beam is reflected back to the measurement system through the surface of the sample. When passing through the pinholes on the MPD again, the reflected light will only retain the focused light points. Finally, the beam of light is reflected by a splitter and imaged on the camera. By scanning the sample, image information of different depths can be obtained.
Confocal microscopy can provide high-resolution and three-dimensional imaging capabilities. In the field of material production, it can measure surface physical morphology and perform micro nano scale three-dimensional morphology analysis, such as 3D surface morphology, 2D depth morphology, contour (depth, width, curvature, angle), surface roughness, etc.
Under the same objective magnification conditions, confocal microscopy displays clearer and finer image morphology details, with higher lateral resolution. Proficient in detecting micro and nano level rough contours, able to provide colorful true color images for easy observation.
The role of confocal microscopy
Confocal microscope is a detection instrument used for micro and nano level measurements of various precision devices and material surfaces. It is an optical detection instrument that uses confocal technology as the principle, combined with precision Z-axis scanning modules, 3D modeling algorithms, etc., to perform non-contact scanning on the surface of the device and establish a surface 3D image. The 3D image of the device surface is processed and analyzed through system software, and 2D and 3D parameters reflecting the surface quality of the device are obtained, thereby achieving 3D measurement of the surface morphology of the device.
