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Methods for life extension of metallographic microscope systems

Jul 05, 2024

Methods for life extension of metallographic microscope systems

 

1. If conditions permit, it is recommended that your laboratory should have three protective conditions: shockproof (away from the earthquake source), moisture-proof (using air conditioning and dryers), and dustproof (covering the ground with a floor); Power supply: 220V ± 10%, 50Hz; Temperature: 0 ° C-40 ° C.


2. When focusing, be careful not to let the objective lens touch the sample to avoid scratching the objective lens.


3. Do not switch the objective lens when the center of the pad circular hole on the stage is far from the center of the objective lens to avoid scratching it.


4. Brightness adjustment should not be too bright or too bright, as it may affect the lifespan of the light bulb and also damage vision.


5. All (functions) switches should be light and in place.


6. When shutting down, adjust the brightness to the minimum.


7. Non professionals should not adjust the lighting system (filament position light) to avoid affecting the imaging quality.


8. When replacing halogen lamps, pay attention to high temperatures to avoid burns; Be careful not to directly touch the glass body of the halogen lamp with your hands.


9. When turned off and not in use, adjust the objective lens to the lowest position through the focusing mechanism.


10. When shutting down and not in use, do not immediately cover the dust cover. Wait for it to cool down before covering it, and pay attention to fire prevention. The above points are only some areas that need special attention. I hope everyone should be careful and careful when using the microscope. If there are any problems that cannot be solved by themselves when using the microscope, you can immediately contact the microscope merchant by phone to find a solution.


characteristic:
1. Scanning transmission electron microscopy technology requires a high level of vacuum, and electronic systems are more complex than TEM and SEM.

2. The low acceleration voltage can significantly reduce the damage of the electron beam to the sample and greatly improve the contrast of the image, making it particularly suitable for transmission analysis of soft material samples such as organic polymers and biology.


3. Thicker specimens and low contrast specimens can be observed.


4. The strong excitation of the objective lens during scanning transmission mode can achieve micro area diffraction.


5. When using the scanning transmission electron microscopy mode of scanning electron microscopy to observe biological samples, the samples can be directly observed without staining to obtain high contrast images.

 

5 Digital Soldering microscope

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