Operation and Troubleshooting of Measuring Projectors and Measuring Microscopes
1. Measure the magnification of the projector microscope and observe how to adapt to different requirements
Measurement projector microscope is used for three-dimensional inspection and observation of electronic components, integrated circuit boards, rotary cutting tools, magnets, etc. How to adapt to these different requirements based on the fact that these different objects need to be observed at different magnifications? It can be solved through multiple aspects. a. It can be achieved through optical performance. b. It can be selected for video observation. c. It can be achieved through mechanical performance. d. It can be illuminated by a light source
Optical performance: Based on the observation requirements of the measured object, different eyepieces/objectives are selected to solve problems such as high magnification and large field of view. When only high magnification is required, it can be achieved by replacing the high magnification eyepiece and objective lens. When a large field of view is required, it can be achieved by replacing the objective lens, reducing the eyepiece, or replacing the large field of view eyepiece.
Video observation: When the optical magnification is insufficient, electronic magnification can be used as compensation. When observing and wanting to store and preserve simultaneously, we can choose videos. There are various video formats: A. It can be directly accessed through a monitor B. It can be connected to a computer (via a digital CCD or analog CCD image acquisition card) C. It can be connected to a digital camera (different digital cameras need to consider different interfaces and compatibility with the microscope)
Mechanical performance: When encountering welding, assembly, inspection of large integrated circuit boards, and requirements for working distance, we can solve them through mechanical performance, such as universal brackets, rocker arm brackets, large mobile platforms, etc. With their performance characteristics, we can directly complete our detection work by using brackets and platforms when detecting large objects. No need to move our tested object. For example, Company A found it difficult to move the circuit board due to its large size and the need for slight tilting observation. Therefore, the inspection work could only be completed through mechanical movement, and the use of universal brackets could meet these usage requirements simultaneously.
Light source illumination: Light source illumination plays a crucial role in whether the measured object can be seen clearly. When selecting illumination, it is necessary to choose the corresponding lighting tool and lighting method based on the characteristics of the measured object itself (considering its requirements for light, such as strong/weak/reflective, etc.). If the transmission of the projector microscope cannot meet your lighting needs with oblique illumination, we have also prepared LED cold light source lights, circular lights, single/double fiber cold light source lights, etc. for you.
2. Reflect the microscope's ability to quickly locate and move the object being measured through observation
Place the object under the microscope and first adjust the magnification to the minimum. When the magnification image is clear, place the measured component at the center of the field of view. Then gradually adjust the zoom handwheel on both sides of the microscope until the high magnification image is completely clear. If the component you are observing requires movement observation, a mobile workbench can be equipped, which can move vertically and horizontally with an accuracy of 0.1mm for the movement distance.
