Several development directions of transmission electron microscopy in the future
Transmission electron microscopy projects an accelerated and focused electron beam onto a very thin sample, where the electrons collide with atoms in the sample and change direction, resulting in solid angle scattering. The size of the scattering angle is related to the density and thickness of the sample, so it can form images with different brightness and darkness. The images will be displayed on imaging devices (such as fluorescent screens, films, and photosensitive coupling components) after magnification and focusing.
At present, there are several important development directions for transmission electron microscopy., Improvement in resolution. Resolution has always been the goal and direction of the development of transmission electron microscopy. Developing a new generation of monochromators and aberration correctors can further improve the energy resolution and spatial resolution of transmission electron microscopy, especially for low-pressure electron microscopy. Secondly, develop in-situ transmission electron microscopy technology. In situ transmission electron microscopy has important applications in the fields of material synthesis, chemical catalysis, life sciences, and energy materials. It can observe and control the progress of gas-phase and liquid-phase reactions in real time at the atomic scale, thereby studying the fundamental mechanisms of reactions and other scientific issues. Thirdly, it can be more widely applied in the study of the structure of biomolecules. The widespread application of cryo electron microscopy in the study of biomacromolecule structures will drive the continuous development of cryo electron microscopy technology. The application of cryo electron microscopy in the field of biology is receiving increasing attention, becoming a link and bridge between biomolecules and cells.
With the continuous development and progress of electron microscopy, the resolution of transmission electron microscopy has reached the sub angstrom level, and electron microscopy has become an indispensable characterization tool in the field of materials science. Over the past 80 years since the birth of transmission electron microscopy, people have solved many scientific problems with the help of transmission electron microscopy. Transmission electron microscopy is also constantly developing and improving, with increasingly comprehensive functions and improved performance.
