What are the classifications of industrial inspection microscopes?
Industrial inspection microscope is a widely used inspection equipment in the field of modern industrial inspection, mainly used for observing the microstructure, quality evaluation, and defect detection of small objects. According to different application scenarios and specific requirements, industrial inspection microscopes can be divided into various types of equipment. This article will introduce several common industrial inspection microscopes.
Firstly, there is a video microscope, which does not require an eyepiece and can be directly observed through a display, making it less prone to fatigue during observation. Moreover, the video microscope adopts an integrated body, which has advantages such as easy movement, simple operation, and wide field of view. It is widely used in electronic devices, plastic parts, integrated circuits, chemical materials, glass ceramics, and other fields.
Secondly, a tool microscope can be used to measure the dimensions, angles, and other parameters of the workpiece within the measuring range. It is a multifunctional device widely used in applications such as circuit board testing, hardware testing, and metrology testing.
In addition, there is a differential interference DIC microscope, paired with a professional flat field achromatic long working distance objective, using DIC technology, and a targeted coaxial light source. The entire field of view has uniform interference colors, clear images, and high contrast. Make the small height difference on the surface of the tested object produce a significant relief effect, which can clearly identify cracks, protrusions, particles, and holes.
As one of the important equipment in the field of modern industrial testing, industrial inspection microscopes have a rich variety of types and application scenarios. In the actual purchase and use process, it is necessary to select appropriate equipment types and magnifications based on specific needs and sample characteristics to achieve high-level detection and observation effects.
