Optical Microscope (OM) Analysis
The imaging principle of an optical microscope is to use visible light to irradiate the surface of a specimen, causing local scattering or reflection to form different contrasts. However, due to the wavelength of visible light being as high as 4000-7000 angstroms, it is naturally the worst in terms of resolution (or discrimination, resolution, referring to the closest distance between two points that can be resolved). Under normal operation, due to the visual discrimination rate of only 0.2 mm, when the optimal resolution of an optical microscope is only 0.2 um, the theoretical maximum magnification is only 1000 X, which is limited. However, the field of view is actually the largest among various imaging systems, indicating that optical microscope observation can still provide many preliminary structural data.
Machine type
Analysis application
The magnification and resolution of optical microscopes, although unable to meet the needs of many material surface observations, are still widely used in various applications such as:
Observation of cross-sectional structure of components;
Analysis and observation of planar Delayer structure;
Observation of Precipitant Free Zone for precipitates;
Observation of differential wiring and over etched dents;
Research on Oxidation Enhanced Stacking Faults (OSF).
