Sharing of SEM technology for scanning electron microscopy
Principle of SEM analysis using scanning electron microscopy: Using electronic technology to detect the secondary electrons, backscattered electrons, absorbed electrons, X-rays, etc. generated during the interaction between high-energy electron beams and samples, and amplifying them into images
The representation methods of spectrograms include backscattered images, secondary electron images, absorption current images, line and surface distributions of elements, etc
Information provided: fracture morphology, surface microstructure, microstructure inside the film, micro zone element analysis and quantitative element analysis, etc
Application scope of scanning electron microscopy (SEM):
1. Analysis of material surface morphology and observation of micro area morphology
2. Analysis of various material shapes, sizes, surfaces, cross-sections, and particle size distribution
3. Observation of surface morphology, roughness and thickness analysis of various thin film samples
SEM testing project
1. Analysis of material surface morphology and observation of micro area morphology
2. Analysis of various material shapes, sizes, surfaces, cross-sections, and particle size distribution
3. Observation of surface morphology, roughness and thickness analysis of various thin film samples
The preparation of scanning electron microscopy samples is simpler than that of transmission electron microscopy samples, and does not require embedding or sectioning.
Sample requirements:
The sample must be solid; Meet the requirements of non-toxic, non radioactive, non polluting, non magnetic, anhydrous, and stable composition.
Preparation principle:
Samples with surface contamination should be properly cleaned and then dried without damaging the surface structure of the sample;
Newly broken fractures or cross-sections generally do not require treatment to avoid damaging the fracture or surface
Structural state;
The surface or fracture of the sample to be eroded should be cleaned and dried;
Pre demagnetization of magnetic samples;
The sample size should be suitable for the size of the instrument specific sample holder.
Common methods:
bulk sample
Blocky conductive material: No need for sample preparation, use conductive adhesive to bond the sample onto the sample holder for direct observation.
Blocky non-conductive (or poorly conductive) materials: First, use the coating method to treat the sample to avoid charge accumulation and affect image quality.
