What are the main characteristics of a metallographic microscope
1. The metallographic microscope is specially designed for all inspection and measurement tasks in the inspection of metals and industrial materials.
2. Mainly providing reflection observation configuration to meet the routine detection and analysis of metallographic samples.
3. The overall optical path supports a field of view diameter of 20mm.
4. Four hole manual objective turntable.
5. Provide halogen lighting with built-in 35W halogen lamp or external 100W transformer.
6. Can provide bright field and polarized light observation methods.
7. Can be paired with Leica's objective lenses of various multiples. Can be equipped with a fixed sample stage or a three board mobile sample stage. The metallographic microscope can be equipped with cameras, digital cameras, and other image acquisition devices to achieve image storage, and can be used in conjunction with analysis software for image analysis.
The metallographic microscope, with its fully automatic differential interference phase contrast (DIC) and 1.25x full field mirror, can detect even small details. The ultra deep field high-definition image allows for a clear view of small details, meeting the high-quality image requirements for detection.
Scanning electron microscopy is as easy to operate as a digital camera, maintaining high resolution and depth of field while easily obtaining large magnification images. With the powerful electronic optical properties of scanning electron microscopy, it helps to accelerate research in life sciences and defect analysis of processed materials.
This device is easy to operate in basic aspects such as autofocus, automatic contrast ratio, and automatic brightness control, without the need for special sample processing preparations such as coating or drying. It has two operating modes of high vacuum and low vacuum, as well as three acceleration voltage settings, suitable for various application fields. All of these can be programmed in pre-set solution files, maintaining high resolution and large depth of field while easily obtaining large magnification images. It has the powerful electronic optical performance of scanning electron microscopy.
The scanning electron microscope emits an electron beam (with a diameter of about 50um) from an electron gun, which is converged by a magnetic lens system under the action of an accelerating voltage to form an electron beam with a diameter of 5nm. It is focused on the surface of the sample, and under the action of a deflection coil between the second focusing lens and the objective lens, the electron beam undergoes a grating like scan on the sample. The electrons interact with the sample to generate signal electrons, which are collected by the detector and converted into photons. They are then amplified by an electrical signal amplifier and imaged on the display system.
The structure of a scanning electron microscope includes an electron optical system, signal collection, image display and recording system, and a vacuum system. This part mainly consists of an electron gun, electromagnetic lens, scanning coil, and sample chamber. The electron gun provides a stable electron source, forming an electron beam. Generally, a tungsten cathode electron gun is used, and a tungsten wire with a diameter of about 0.1 mm is bent into a hairpin shape, forming a V-shaped tip with a radius of about 100 μ m. When the filament current passes through, the filament is heated and when it reaches the operating temperature, it emits electrons. High voltage is applied between the cathode and anode, and these electrons accelerate towards the anode, forming an electron beam. Under the action of a high-voltage electric field, the electron beam is accelerated through the anode axis hole and enters the electromagnetic field.
