What are the types of industrial inspection microscopes?
Industrial inspection microscope is a widely used detection equipment in the modern industrial inspection field, mainly used for observing the microstructure of small objects, quality assessment, and defect detection. According to different application scenarios and specific requirements, industrial inspection microscopes can be divided into various types of equipment. This article will introduce several common industrial inspection microscopes.
Firstly, there is a video microscope that does not require an eyepiece and can be directly observed through a display. It is not prone to fatigue during observation, and the video microscope adopts an integrated body, which has the advantages of easy movement, simple operation, and wide field of view. It is widely used in electronic devices, plastic parts, integrated circuits, chemical materials, glass ceramics and other fields.
Next is the tool microscope, which can be used to measure parameters such as size and angle of workpieces within the measuring range. It is a multifunctional device widely used in applications such as circuit board inspection, hardware inspection, and measurement testing.
In addition, there is also a differential interference DIC microscope, equipped with a professional flat field achromatic long working distance objective lens, using DIC technology and a specially designed coaxial light source. The entire field of view has uniform interference colors, clear images, and high contrast. The small height difference on the surface of the tested object produces a noticeable relief effect, which can clearly identify cracks, protrusions, particles, and holes.
Industrial inspection microscopes, as one of the important equipment in the field of modern industrial inspection, have a rich variety of types and application scenarios. In the actual purchase and use process, it is necessary to select appropriate equipment types and magnification factors based on specific needs and sample characteristics to achieve high-level detection and observation effects.
