A brief analysis of the principles and applications of DIC in metallographic microscopes
When everyone is doing metallographic microscope observation, there is an observation method called differential interference contrast method, also called DIC observation method. This is a relatively advanced method that is currently only used in foreign brand equipment. The specific principle is as follows: Introduce it.
Components required for a metallographic microscope: polarizer, analyzer, differential interference DIC chip (made of glacial stone).
Polarizers and analyzers are indispensable basic supporting components in the orthogonal polarized light observation of metallographic samples. They are assembled in the bright/dark field illumination assembly and are also indispensable components for the differential interference contrast method. The polarizer of a metallographic microscope changes the light source into linearly polarized light that vibrates in the east-west direction; the analyzer can interfere with coherent light that meets the interference conditions.
The differential interference DIC plate of a metallographic microscope is the core component of the differential interference contrast method. Its thickness changes slightly, causing slight changes in the optical path or optical path difference, and produces an obvious interference contrast effect;
Applications of differential interference DIC sheets in metallographic microscopes:
Observe the particles, cracks, holes and bulges on the surface of the object, which appear in relief, and you can make correct judgments.
The surface requirements of some workpieces are reduced. As long as polishing does not require corrosion, the phase transformation relief of martensite can be seen.
Observe some surface particle changes, such as conductive ion observation, etc.
Through the above explanation, I believe everyone has a certain understanding of the principle and application of differential interference DIC sheets in metallographic microscopes.
