Introduction to Scanning Probe Microscope Features
Scanning Probe Microscope (Scanning Probe Microscope, SPM) is the scanning tunneling microscope and in the scanning tunneling microscope on the basis of the development of a variety of new probe microscope (atomic force microscope AFM, laser force microscope LFM, magnetic force microscope MFM and so on) collectively, is the international development of the surface of the analytical instruments in recent years, is the comprehensive use of Optoelectronics technology, laser technology, weak signal detection technology, precision mechanical design and processing, automatic control technology, digital signal processing technology, applied optical technology, computer high-speed acquisition and control and high-resolution graphic processing technology and other modern scientific and technological achievements of optical, mechanical and electrical integration of high-tech products. This new type of microscopic tool has obvious advantages compared with various microscopes and analytical instruments in the past:
1, SPM has a very high resolution. It can easily "see" the atom, which is difficult to reach the general microscope and even electron microscope.
2, SPM is a real-time, real sample surface high-resolution image, is really see the atom. Unlike some analytical instruments, the surface structure of the sample is deduced by indirect or computational methods.
3,SPM is used in a relaxed environment. Electron microscope and other instruments on the working environment requirements of the more demanding, the sample must be placed in a high vacuum conditions in order to test. SPM can work in vacuum, but also in the atmosphere, low temperature, room temperature, high temperature, and even in solution. Therefore, SPM is suitable for scientific experiments in various working environments.
