The Characteristics of Scanning Probe Microscopes
Scanning probe microscope is a general term for various new probe microscopes (atomic force microscope, electrostatic force microscope, magnetic force microscope, scanning ion conductivity microscope, scanning electrochemical microscope, etc.) developed on the basis of scanning tunneling microscope. It is a surface analysis instrument developed internationally in recent years.
Scanning probe microscope is the third type of microscope that observes material structures at the atomic scale, following field ion microscopy and high-resolution transmission electron microscopy. Taking scanning tunneling microscope (STM) as an example, its lateral resolution is 0.1~0.2nm, and its longitudinal depth resolution is 0.01nm. Such resolution can clearly observe individual atoms or molecules distributed on the surface of the sample. Meanwhile, scanning probe microscopes can also be used for observation and research in air, other gases, or liquid environments.
Scanning probe microscopes have characteristics such as atomic resolution, atomic transport, and nano microfabrication. However, due to the different working principles of various scanning microscopes, the surface information of the sample reflected by their results is very different. The scanning tunneling microscope measures the electron distribution information on the surface of the sample, with atomic level resolution but still unable to obtain the true structure of the sample. Atomic microscopy detects the interaction information between atoms, thus obtaining the arrangement information of atomic distribution on the surface of the sample, which is the true structure of the sample. On the other hand, atomic force microscopy cannot measure electronic state information that can be compared with theory, so both have their own strengths and weaknesses.
