A simplified analysis of the advantages and disadvantages of atomic force microscopy
The atomic force microscope is a microscope that uses a micro-cantilever to sense and amplify the force between the sharp probe on the cantilever and the atoms of the sample under test, so as to achieve the purpose of detection, with atomic-level resolution. Since the atomic force microscope can observe both conductors and non-conductors, it makes up for the shortcomings of scanning tunneling microscopes. The atomic force microscope was invented by Gerd Binning of IBM's Zurich Research Center and Calvin Quate of Stanford University in 1985. Its purpose is to make non-conductors similar to scanning probe microscopes (SPM) observation method. The biggest difference between the atomic force microscope (AFM) and the scanning tunneling microscope (STM) is that it does not use the electron tunneling effect, but detects the contact between atoms, atomic bonding, van der Waals force or Casimir effect, etc. The surface properties of the sample.
Advantages of Atomic Force Microscopy:
Atomic force microscopy has many advantages over scanning electron microscopy. Unlike electron microscopes, which only provide two-dimensional images, AFMs provide true three-dimensional maps of surfaces. At the same time, AFM does not require any special treatment of the sample, such as copper plating or carbon plating, which can cause irreversible damage to the sample. Third, electron microscopes need to operate under high vacuum conditions, while atomic force microscopes can work well under normal pressure and even in liquid environments. This can be used to study biological macromolecules and even living biological tissues.
Disadvantages of AFM:
Compared with scanning electron microscopy, the disadvantages of AFM are that the imaging range is too small, the speed is slow, and it is too much affected by the probe. The atomic force microscope is a new type of instrument with atomic-level high resolution invented after the scanning tunneling microscope. It can detect the physical properties of various materials and samples in the nanometer region, including the morphology, or directly conduct nanometer Manipulation; It has been widely used in the fields of semiconductors, nano functional materials, biology, chemical industry, food, pharmaceutical research and various nano-related subjects in scientific research institutes, and has become a basic tool for nano-science research.
Compared with the scanning tunneling microscope, the atomic force microscope has wider applicability because it can observe non-conductive samples. The scanning force microscope, which is widely used in scientific research and industry, is based on the atomic force microscope.
