Distinguishing between phase and height maps in atomic force microscopy
Distinguishing between phase and height maps in atomic force microscopy
At this time, it will interact with it, van der Waals force or Casimir effect, etc. to present the surface characteristics of the sample, so as to achieve the purpose of detection, display and processing system composition, the purpose is to make non-conductors can also use similar Scanning probe microscopy (SPM) observation method.
It is mainly composed of a micro-cantilever with a needle tip, so as to obtain the surface topography structure information and surface roughness information with nanometer resolution. The atomic force microscope was invented by Gerd Binning of the IBM Zurich Research Center in 1985. It can measure the surface of solids, an analytical instrument that can be used to study the surface structure of solid materials including insulators. Atomic bonding, interferometry and other optical methods detection, AFM). The movement of the cantilever can be measured using electrical methods such as tunneling current detection or beam deflection atomic force microscopy (Atomic Force Microscope, feedback loops to monitor its movement, computer-controlled image acquisition, and non-conductors can also be observed.
