How to Observe Conductive Particles with Metallurgical Microscope OMT-4R
The OMT-4R series metallurgical microscope, equipped with polarizer, analyzer and DIC (Differential Interference Contrast), enables clear observation of conductive particles on the screen and verification whether the quantity of conductive particles meets the requirements.
First of all, a metallurgical microscope fitted with DIC, polarizer and analyzer is required for conductive particle observation. Objectives of no more than 20× are generally preferred for this application. Higher magnification will cause blurry images due to insufficient depth of field, resulting in poor observation results.
After preparing the metallurgical microscope and the required samples, you may start the observation. First pull out the DIC module, polarizer and analyzer. Place the sample on the stage and adjust the focus. Move the stage to locate the target observation area. Insert the polarizer and analyzer, and view the sample through the eyepiece. Adjust the analyzer until the field of view reaches extinction. Then insert the DIC module and adjust the DIC optics under polarized light until the conductive particles are clearly visible.
